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Brand Name : Topfer
Model Number : Top-Smart 1100
Place of Origin : China
MOQ : one set
Price : to be discussed
Payment Terms : T/T
Supply Ability : 10 sets /30 days
Delivery Time : 2 to 3 weeks
Packaging Details : wooden crate
Color : gray
simultaneously measurable : 4-16 power supply products
Altitude : 1.7m
High-voltage Hipot power supply testing system, customizable for multiple groups to test simultaneously, supports all-round testing of various power supplies
Open hardware platform, and various test devices (including devices with interfaces such as GPIB,RS-232,USB, etc.) can be added or removed according to customer requirements; An open software platform that can be expanded with various new test items and functions according to the testing requirements of customers. It supports simultaneous multi-channel barcode pre-scanning function and also supports barcode scanning while testing, improving the overall testing speed.
Support all-round testing of various power supplies (adapters/chargers, LED power supplies, PC power supplies, inverter power supplies, communication power supplies, etc.); Comply with the measurement requirements of ENERGY STAR and IEC 62301; Support the interface of manufacturing information system (ShopFloor); Support various power parameter tests in CCV, CC, CR, and CP modes; Optimize the display mode and combine the hardware configuration at will; Supports simultaneous testing of multiple single-group/multi-group output power supplies, significantly enhancing the production line's capacity (the testing speed of adapters/chargers /LED power supplies is more than double that of the 6000 series power supply testing system, which is widely used). Parallel Bar Code scanning (Bar Code Reader) is carried out during the test, which greatly improves the test speed.
Features of the Top-Smart 1100 Power Testing System:
Open:
Universal:
High-Speed:
Test Items of the Power Testing System Top-Smart 1100:
Test items | Test items |
DC output voltage | Input voltage ramp |
DC output current | Input freq. ramp |
Peak-Peak noise | Tracking |
Transient response time | Short circuit test |
Transient spike | Short circuit current |
Voltage regulation | OV protection |
Current regulation | UV protection |
Turn ON time | OL protection |
Rise time | OP protection |
Fall time | In-test adjustment |
Hold-up time | AC cycle drop out |
Inrush current test | PLD simulation |
Power good signal | GPIB read/write |
Power fail signal | 232 read/write |
P/S ON signal | USB read/write |
Power up sequence | TTL signal control |
Power off sequence | Relay control |
Effciency | Bar code scan |
Input RMS current | Dynamic test |
Input power | DC Current under C.V.Mode |
Input power factor | DC : specification under C.P.Mode |
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High-Voltage Hipot Power Supply Testing System, Customizable For Multiple Groups To Test Simultaneously, Supports All-Round Testing Of Various Power Images |